In this paper, we consider the problem of reducing the bit error rate of flash-based solid state drives (SSDs) when cells are subject to inter-cell interference (ICI). By observing that the outputs of adjacent victim cells can be correlated due to common aggressors, we propose a novel channel model to accurately represent the true flash channel. This model, equivalent to a finite-state Markov channel model, allows the use of the sum-product algorithm to calculate more accurate posterior distributions of individual cell inputs given the joint outputs of victim cells. These posteriors can be easily mapped to the log-likelihood ratios that are passed as inputs to the soft LDPC decoder. When the output is available with high precision, our simulation showed that a significant reduction in the bit-error rate can be obtained, reaching $99.99\%$ reduction compared to current methods, when the diagonal coupling is very strong. In the realistic case of low-precision output, our scheme provides less impressive improvements due to information loss in the process of quantization. To improve the performance of the new detector in the quantized case, we propose a new iterative scheme that alternates multiple times between the detector and the decoder. Our simulations showed that the iterative scheme can significantly improve the bit error rate even in the quantized case.