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Policy Split: Incentivizing Dual-Mode Exploration in LLM Reinforcement with Dual-Mode Entropy Regularization METER: Evaluating Multi-Level Contextual Causal Reasoning in Large Language Models Think Before you Write: QA-Guided Reasoning for Character Descriptions in Books METRO: Towards Strategy Induction from Expert Dialogue Transcripts for Non-collaborative Dialogues Retrieval as Generation: A Unified Framework with Self-Triggered Information Planning Do LLMs Know Tool Irrelevance? Demystifying Structural Alignment Bias in Tool Invocations Enhancing Multimodal Large Language Models for Ancient Chinese Character Evolution Analysis via Glyph-Driven Fine-Tuning Exploring Knowledge Conflicts for Faithful LLM Reasoning: Benchmark and Method CocoaBench: Evaluating Unified Digital Agents in the Wild MathAgent: Adversarial Evolution of Constraint Graphs for Mathematical Reasoning Data Synthesis Efficient Training for Cross-lingual Speech Language Models Shared Emotion Geometry Across Small Language Models: A Cross-Architecture Study of Representation, Behavior, and Methodological Confounds A Systematic Analysis of the Impact of Persona Steering on LLM Capabilities Uncertainty-Aware Web-Conditioned Scientific Fact-Checking When Valid Signals Fail: Regime Boundaries Between LLM Features and RL Trading Policies When Verification Fails: How Compositionally Infeasible Claims Escape Rejection Mem$^2$Evolve: Towards Self-Evolving Agents via Co-Evolutionary Capability Expansion and Experience Distillation AOP-Smart: A RAG-Enhanced Large Language Model Framework for Adverse Outcome Pathway Analysis Advancing Polish Language Modeling through Tokenizer Optimization in the Bielik v3 7B and 11B Series TInR: Exploring Tool-Internalized Reasoning in Large Language Models Do BERT Embeddings Encode Narrative Dimensions? A Token-Level Probing Analysis of Time, Space, Causality, and Character in Fiction Generating Multiple-Choice Knowledge Questions with Interpretable Difficulty Estimation using Knowledge Graphs and Large Language Models Deep-Reporter: Deep Research for Grounded Multimodal Long-Form Generation Too Nice to Tell the Truth: Quantifying Agreeableness-Driven Sycophancy in Role-Playing Language Models Learning and Enforcing Context-Sensitive Control for LLMs Efficient Process Reward Modeling via Contrastive Mutual Information Computational Lesions in Multilingual Language Models Separate Shared and Language-specific Brain Alignment Bridging Linguistic Gaps: Cross-Lingual Mapping in Pre-Training and Dataset for Enhanced Multilingual LLM Performance Early Decisions Matter: Proximity Bias and Initial Trajectory Shaping in Non-Autoregressive Diffusion Language Models LLMs Should Incorporate Explicit Mechanisms for Human Empathy
Transforming Computational Lithography with AC and AI -- ...
Saumyadip Mukhopadhyay, Kiho Yang, Kasyap Thottasserymana Vasude · 2026-01-28 · via cs.AI updates on arXiv.org

From climate science to drug discovery, scientific computing demands have surged dramatically in recent years -- driven by larger datasets, more sophisticated models, and higher simulation fidelity. This growth rate far outpaces transistor scaling, leading to unsustainably rising costs, energy consumption, and emissions. Semiconductor manufacturing is no exception. Computational lithography -- involving transferring circuitry to silicon in diffraction-limited conditions -- is the largest workload in semiconductor manufacturing. It has also grown exceptionally complex as miniaturization has advanced in the angstrom-era, requiring more accurate modeling, intricate corrections, and broader solution-space exploration. Accelerated computing (AC) offers a solution by dramatically freeing up the compute and power envelope. AI augments these gains by serving as high-fidelity surrogates for compute-intensive steps. Together, they present a sustainable, next-generation computing platform for scientific workloads. This new paradigm needs a fundamental redesign of the software stack. For computational lithography, NVIDIA cuLitho reinvents the core primitives -- diffractive optics, computational geometry, multi-variant optimization, data processing -- to achieve a transformative 57X end-to-end acceleration. Beyond dramatically faster cycles, this expanded compute envelope enables more rigorous solutions, including curvilinear masks, high-numerical aperture extreme ultraviolet (high-NA EUV) lithography, and subatomic modeling. We reinvest a small fraction of the freed-up compute to include through-focus correction for better process resilience. Silicon experiments at IMEC show significant benefits compared to conventional methods -- 35% better process window and 19% better edge placement error. This is the first quantified chip-scale demonstration of the lithography benefits of AC and AI in silicon.