ES-FUZZ: Improving the Coverage of Firmware Fuzzing with Stateful and Adaptable MMIO Models
Wei-Lun Huang, Kang G. Shin
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2024-03-11
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via cs.CR updates on arXiv.org
arXiv:2403.06281v4 Announce Type: replace Abstract: Fuzzing has been widely used for testing embedded-system …
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