






















We propose a low-complexity Chase decoder for optical interconnects that formulates test pattern selection as a generalized maximum coverage problem. For concatenated RS-BCH and oFEC codes, our decoder achieves the standard Chase decoding performance with 25% and 61.3% fewer test patterns, respectively.
此内容由惯性聚合(RSS阅读器)自动聚合整理,仅供阅读参考。 原文来自 — 版权归原作者所有。