Random number generators that utilize arrays of entropy source elements suffer from bias variation (BV). Despite the availability of efficient debiasing algorithms, optimized implementations of hardware friendly options depend on the bit bias in the raw bit streams and cannot accommodate a wide BV. In this work, we present a 64 x 64 array of perimeter gated single photon avalanche diodes (pgSPADs), fabricated in a 0.35 μm standard CMOS technology, as a source of entropy to generate random binary strings with a BV compensation technique. By applying proper gate voltages based on the devices' native dark count rates, we demonstrate less than 1% BV for a raw-bit generation rate of 2 kHz/pixel at room temperature. The raw bits were debiased using the classical iterative Von Neumann's algorithm and the debiased bits were found to pass all of the 16 tests from NIST's Statistical Test Suite.