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Nicolas Sarkis, Inria Saclay - Île-de-France Research Centre, Computer Science Laboratory of the École Polytechnique, Institut Polytechnique de Paris
Benjamin Smith, Inria Saclay - Île-de-France Research Centre, Computer Science Laboratory of the École Polytechnique, Institut Polytechnique de Paris
We give efficient formulas to evaluate isogenies of ordinary elliptic curves over finite fields of characteristic $2$, extending the odd-characteristic techniques of Hisil--Costello and Renes to binary fields. For odd prime degree $\ell = 2s+1$, our affine product evaluation computes the image $x$-coordinate using $5s\mathbf{M}$ field multiplications, or $4s\mathbf{M}$ when the kernel points are normalized. We derive an inversion-free variant that evaluates the $x$-map in projective and twisted Kummer coordinates, allowing carried points to remain projective across successive isogeny steps. Over $\mathbb{F}_{2^{511}}$, microbenchmarks show that the inversion-free projective and twisted variants are faster than Vélu-style $x$-evaluation when outputs are kept in projective/twisted form, while the affine one-inversion variant is about $4.2\times$ faster.
Note: fix some small typos, thanks Samuel Frengley.
BibTeX
@misc{cryptoeprint:2026/704,
author = {Gustavo Banegas and Nicolas Sarkis and Benjamin Smith},
title = {Fast Isogeny Evaluation on Binary Curves},
howpublished = {Cryptology {ePrint} Archive, Paper 2026/704},
year = {2026},
url = {https://eprint.iacr.org/2026/704}
}
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